Issued Patents 2024
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12176179 | Method, device and system for reducing off-axial aberration in electron microscopy | Maarten Bischoff, Tjerk G. Spanjer, Stan Johan Pieter Konings | 2024-12-24 |
| 12100585 | Energy spectrometer with dynamic focus | Arthur Reinout Hartong, Alexander Henstra, Sorin Lazar | 2024-09-24 |
| 11988618 | Method and system to determine crystal structure | Bart Buijsse, Hans Raaijmakers | 2024-05-21 |
| 11955310 | Transmission charged particle microscope with an electron energy loss spectroscopy detector | — | 2024-04-09 |
| 11948771 | Method of determining an energy width of a charged particle beam | — | 2024-04-02 |