Issued Patents 2024
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12176179 | Method, device and system for reducing off-axial aberration in electron microscopy | Peter Christiaan Tiemeijer, Tjerk G. Spanjer, Stan Johan Pieter Konings | 2024-12-24 |