Issued Patents 2024
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11880145 | Method for measuring a substrate for semiconductor lithography | Oliver Jaeckel | 2024-01-23 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11880145 | Method for measuring a substrate for semiconductor lithography | Oliver Jaeckel | 2024-01-23 |