Issued Patents 2024
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12045969 | Automated root cause analysis for defect detection during fabrication processes of semiconductor structures | Jens Timo Neumann, Eugen Foca, Ramani Pichumani, Abhilash Srikantha, Christian Wojek +1 more | 2024-07-23 |