Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12061229 | In-line electrical detection of defects at wafer level | Yu-Hsuan Huang, Pei-Hsuan Lee | 2024-08-13 |
| 12002660 | Semiconductor manufacturing chamber with plasma/gas flow control device | — | 2024-06-04 |