Issued Patents 2024
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12040187 | In-die metrology methods and systems for process control | Lingling PU, Wei Fang | 2024-07-16 |
| 11961697 | Apparatus using charged particle beams | Xuerang Hu, Xuedong Liu, Weiming Ren | 2024-04-16 |
| RE49784 | Apparatus of plural charged-particle beams | Weiming Ren, Xuedong Liu, Xuerang Hu | 2024-01-02 |