| 12165341 |
Optical resolution measurement method for optical devices |
Yangyang SUN, Ludovic Godet |
2024-12-10 |
| 12159392 |
Die system and method of comparing alignment vectors |
Yongan Xu, Chan Juan XING, Yifei Wang, Ludovic Godet |
2024-12-03 |
| 12153344 |
Lithography method to form structures with slanted angle |
Yongan Xu, Jhenghan YANG, Ludovic Godet |
2024-11-26 |
| 12140494 |
Method to measure light loss of optical films and optical substrates |
Kang Luo, Fariah Hayee, Ludovic Godet |
2024-11-12 |
| 12085475 |
Method to determine line angle and rotation of multiple patterning |
Yongan Xu, Chan Juan XING, Ludovic Godet |
2024-09-10 |
| 12050327 |
Imaging system and method of manufacturing a metalens array |
Tapashree Roy, Ludovic Godet, Wayne MCMILLAN, Robert Jan Visser |
2024-07-30 |
| 12021102 |
Imaging system and method of creating composite images |
Yongan Xu, Ludovic Godet, Naamah ARGAMAN, Robert Jan Visser |
2024-06-25 |
| 12019242 |
Full-field metrology tool for waveguide combiners and meta-surfaces |
Yangyang SUN, Ludovic Godet |
2024-06-25 |
| 12003841 |
Edge inspection system for inspection of optical devices |
Michael David-Scott Kemp |
2024-06-04 |
| 11988574 |
Illumination system for AR metrology tool |
Yangyang SUN, Kazuya Daito, Ludovic Godet |
2024-05-21 |
| 11978196 |
See-through metrology systems, apparatus, and methods for optical devices |
Yangyang SUN, Kazuya Daito, Ludovic Godet |
2024-05-07 |
| 11913776 |
Interference in-sensitive Littrow system for optical device structure measurement |
Yangyang SUN, Ludovic Godet |
2024-02-27 |
| 11892367 |
Method to measure light loss of optical films and optical substrates |
Kang Luo, Fariah Hayee, Ludovic Godet |
2024-02-06 |
| 11873554 |
Ion implantation to modify glass locally for optical devices |
Nai-Wen Pi, Kang Luo, Ludovic Godet |
2024-01-16 |