Issued Patents 2024
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12098914 | Surface roughness and emissivity determination | Todd Egan, Mehdi Vaez-Iravani | 2024-09-24 |
| 12062583 | Optical metrology models for in-line film thickness measurements | Edward W. Budiarto, Sergey Starik, Todd Egan | 2024-08-13 |
| 12015451 | Joint transmit/receive image compensation with blind adaptive calibration in a transceiver system | Kartik Sridharan | 2024-06-18 |