Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11835483 | Magnetic flaw detection method, magnetic field measurement processing apparatus, and magnetic flaw detection apparatus | Shinya Mito, Kazunori Miyazawa, Fumitake Terao, Shoma Takeda | 2023-12-05 |