DY

Daisuke Yokoi

NE Nec: 2 patents #200 of 887Top 25%
Overall (2023): #161,710 of 537,848Top 35%
2
Patents 2023

Issued Patents 2023

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
11586981 Failure analysis device, failure analysis method, and failure analysis program Ichirou Akimoto, Yousuke MOTOHASHI, Naoki Sawada, Masayuki Ikeda 2023-02-21
11568313 Control apparatus, analysis apparatus, communication system, data processing method, data transmission method, and non-transitory computer readable medium Tadashi Ishikawa, Takuya Itou, Ichirou Akimoto 2023-01-31