Issued Patents 2023
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11828794 | Placement table, testing device, and testing method | Tomohiro Ota | 2023-11-28 |
| 11776829 | Dummy wafer | Yutaka Akaike, Yoshiyasu Kato, Hiroyuki Nakayama, Hiroaki KOMIYA | 2023-10-03 |
| 11774488 | Inspection apparatus including power supply for supplying power to heating mechanism used for heating device | Fumiya FUJII | 2023-10-03 |
| 11768236 | Test device control method and test device | Hiroaki AGAWA, Masahito Kobayashi | 2023-09-26 |
| 11762011 | Temperature adjustment method for mounting base, inspection device, and mounting base | — | 2023-09-19 |
| 11668665 | Silicon heater bonded to a test wafer | — | 2023-06-06 |
| 11609149 | State estimation apparatus, state estimation method, and computer-readable recording medium | Yu KIYOKAWA, Shohei Kinoshita | 2023-03-21 |
| 11579040 | Damage diagnosis device, damage diagnosis method, and recording medium in which damage diagnosis program is stored | Shohei Kinoshita, Yu KIYOKAWA | 2023-02-14 |
| 11543445 | Inspection apparatus | Yutaka Akaike, Hiroyuki Nakayama, Yoshinori Fujisawa | 2023-01-03 |