Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11762012 | Wafer inspection system | Junichi Hagihara, Kunihiro Furuya, Tadayoshi Hosaka, Naoki Muramatsu | 2023-09-19 |
| 11567123 | Wafer inspection system | Junichi Hagihara, Kunihiro Furuya, Tadayoshi Hosaka, Naoki Muramatsu | 2023-01-31 |