Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11782809 | Test and measurement system for analyzing devices under test | Daniel S. Froelich, Michelle L. Baldwin, Jonathan San, Lin-Yung Chen | 2023-10-10 |
| 11578925 | Thermal management system for a test-and-measurement probe | Julie A. Campbell, David Thomas Engquist | 2023-02-14 |