Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11680978 | GaN reliability built-in self test (BIST) apparatus and method for qualifying dynamic on-state resistance degradation | Yu-Ann LAI, Kun-Lung Chen, Chun-Yi Yang, Chan-Hong Chern | 2023-06-20 |