Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11726465 | Method for detecting environmental parameter in semiconductor fabrication facility | Yi Yang, Chia-Lin Hsu | 2023-08-15 |
LC
Lee-Chun Chen
Overall (2023): #355,609 of 537,848Top 70%
1
Patents 2023