Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11754616 | Methods and systems to test semiconductor devices based on dynamically updated boundary values | Chin-Hao Chang, Meng-Hsiu Wu, Manoj M. Mhala, Calvin Yi-Ping Chao | 2023-09-12 |