Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11714043 | Specimen analysis system and specimen analysis method | Tomohiro Tsuji | 2023-08-01 |
| 11598724 | Measuring apparatus, measuring apparatus adjustment method and computer program product | Yasuaki Tsuruoka, Tomohiro Tsuji, Motoi KINISHI, Yuji Masuda | 2023-03-07 |