Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11774476 | Input capacitance measurement circuit and method of manufacturing semiconductor device | Masayoshi Hirao, Reona FURUKAWA | 2023-10-03 |
| 11624767 | Semiconductor test apparatus and semiconductor test method | Yasushi Takaki, Kinya YAMASHITA | 2023-04-11 |