Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11821870 | Defect measurement device, defect measurement method, and inspection probe | Hidehiko Suetsugu | 2023-11-21 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11821870 | Defect measurement device, defect measurement method, and inspection probe | Hidehiko Suetsugu | 2023-11-21 |