Issued Patents 2023
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11835991 | Self-test controller, and associated method | Amulya Pandey, Balwinder Singh Soni, Amritanshu Anand | 2023-12-05 |
| 11726140 | Scan circuit and method | Shiv Kumar Vats, Tripti Gupta | 2023-08-15 |
| 11714131 | Circuit and method for scan testing | Manish Sharma, Shiv Kumar Vats, Umesh Chandra Srivastava | 2023-08-01 |
| 11680982 | Automatic test pattern generation circuitry in multi power domain system on a chip | Manish Sharma, Tripti Gupta | 2023-06-20 |
| 11557364 | ATPG testing method for latch based memories, for area reduction | Balwinder Singh Soni, Avneep Kumar Goyal | 2023-01-17 |
| 11550348 | Methods and devices for bypassing a voltage regulator | Mayankkumar Hareshbhai Niranjani, Gourav Garg | 2023-01-10 |