Issued Patents 2023
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11828789 | Test apparatus and jumper thereof | Yi Ming Lau | 2023-11-28 |
| 11804417 | Semiconductor structure comprising heat dissipation member | — | 2023-10-31 |
| 11768223 | Testing device and probe elements thereof | — | 2023-09-26 |
| 11761984 | Probe card device and testing equipment thereof | — | 2023-09-19 |
| 11754619 | Probing apparatus with temperature-adjusting mechanism | Chen-Wen Pan, Jung-Chieh Liu | 2023-09-12 |
| 11567104 | High speed signal transmitting and receiving detection device | — | 2023-01-31 |
| 11549968 | Probing system | — | 2023-01-10 |