Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11733176 | Inspection device and method of measuring wavefront aberration | Akihiro Komatsu | 2023-08-22 |
KO
Ken Ozawa
Overall (2023): #367,240 of 537,848Top 70%
1
Patents 2023