Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11543433 | Probe test card and method of manufacturing the same | Jae Hyoung Seo | 2023-01-03 |
| 11543450 | System and method of testing a semiconductor device | — | 2023-01-03 |
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11543433 | Probe test card and method of manufacturing the same | Jae Hyoung Seo | 2023-01-03 |
| 11543450 | System and method of testing a semiconductor device | — | 2023-01-03 |