Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11549895 | System and method using x-rays for depth-resolving metrology and analysis | Wenbing Yun, Janos Kirz, Sylvia Jia Yun Lewis | 2023-01-10 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11549895 | System and method using x-rays for depth-resolving metrology and analysis | Wenbing Yun, Janos Kirz, Sylvia Jia Yun Lewis | 2023-01-10 |