Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11852674 | Method for locating open circuit failure point of test structure | Cheng-An Wu, Jinde Gao | 2023-12-26 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11852674 | Method for locating open circuit failure point of test structure | Cheng-An Wu, Jinde Gao | 2023-12-26 |