Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11816579 | Method and apparatus for detecting defect pattern on wafer based on unsupervised learning | Min Sik Chu, Seong Mi Park, Jiin Jeong, Jae Hoon Kim, Ho Geun PARK +1 more | 2023-11-14 |
| 11587222 | Method and apparatus for detecting defect pattern on wafer based on unsupervised learning | Min Sik Chu, Seong Mi Park, Jiin Jeong, Jae Hoon Kim, Ho Geun PARK +1 more | 2023-02-21 |