Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11744457 | Method for measuring anomalies of refraction using a reflection image of pupil in visible light | Young Jun Kim, Jae Hyeong Chun | 2023-09-05 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11744457 | Method for measuring anomalies of refraction using a reflection image of pupil in visible light | Young Jun Kim, Jae Hyeong Chun | 2023-09-05 |