Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11740073 | Method for measuring CD using scanning electron microscope | Jooho Kim, Donyun Kim, Yunhyoung Nam, Seungjin Lee | 2023-08-29 |
DC
Dawoon Choi
Seoul National University R&Db Foundation: 1 patents #47 of 476Top 10%
Overall (2023): #476,211 of 537,848Top 90%
1
Patents 2023