Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11755639 | Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessions | Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Mark Uebel, Alan Philip Franks +2 more | 2023-09-12 |