Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11698630 | Abnormality analysis device, abnormality analysis method, and manufacturing system | Hiroshi Amano, Noriaki Hamada, Yosuke Tajika, Nobutaka KAWAGUCHI, Yuichi Higuchi +1 more | 2023-07-11 |