Issued Patents 2023
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11852668 | Method and system for real time outlier detection and product re-binning | Arie Peltz, Dan Sebban | 2023-12-26 |
| 11852684 | Methods and systems for detecting defects on an electronic assembly | Leonid Gurov, Gal Peled, Dan Sebban | 2023-12-26 |
| 11829125 | Augmenting reliability models for manufactured products | Bruce A. Phillips, Michael Schuldenfrei, Dan Sebban | 2023-11-28 |
| 11789074 | Parameter space reduction for device testing | James C. Nagle, Stephen Thung, Sergey Kizunov | 2023-10-17 |
| 11650250 | Methods and systems for detecting defects on an electronic assembly | Leonid Gurov, Gal Peled, Dan Sebban | 2023-05-16 |