Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11791130 | Electron beam observation device, electron beam observation system, and image correcting method and method for calculating correction factor for image correction in electron beam observation device | Koichi Hamada, Momoyo Enyama, Ryou YUMIBA, Makoto Sakakibara, Kei Sakai +4 more | 2023-10-17 |