Issued Patents 2023
Showing 1–20 of 20 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11828797 | Probing device | — | 2023-11-28 |
| 11802910 | Probe apparatus for testing semiconductor devices | — | 2023-10-31 |
| 11798602 | Data receiving circuit with latch and equalizer | — | 2023-10-24 |
| 11770117 | Data receiving circuit | — | 2023-09-26 |
| 11769562 | Semiconductor device including an electronic fuse control circuit | — | 2023-09-26 |
| 11764191 | Method for preparing semiconductor package having multiple voltage supply sources | — | 2023-09-19 |
| 11765883 | Method for manufacturing semiconductor die with decoupling capacitor | — | 2023-09-19 |
| 11756641 | Method for determining status of a fuse element | — | 2023-09-12 |
| 11749364 | Semiconductor circuit and semiconductor device for determining status of a fuse element | — | 2023-09-05 |
| 11742862 | Delay locked loop device and method for operating the same | — | 2023-08-29 |
| 11728794 | Data receiving circuit | — | 2023-08-15 |
| 11715540 | Anti-fuse device | — | 2023-08-01 |
| 11699686 | Dual-die semiconductor package | Chun-Huang Yu | 2023-07-11 |
| 11677403 | Delay lock loop circuit | — | 2023-06-13 |
| 11621238 | Semiconductor device with redistribution pattern and method for fabricating the same | — | 2023-04-04 |
| 11616496 | Data receiving circuit | — | 2023-03-28 |
| 11592474 | Functional test equipment including relay system and test method using the functional test equipment | — | 2023-02-28 |
| 11587632 | Semiconductor device structure having fuse elements | — | 2023-02-21 |
| 11569802 | Temperature delay device and temperature control system | — | 2023-01-31 |
| 11551773 | Method of testing with ground noise | — | 2023-01-10 |