Issued Patents 2023
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11843030 | Fuse elements and semiconductor devices | Yi-Ju Chen | 2023-12-12 |
| 11747394 | Probe apparatus with a track | Yi-Ju Chen | 2023-09-05 |
| 11699624 | Semiconductor structure with test structure | Tsang-Po Yang | 2023-07-11 |
| 11668745 | Probe apparatus having a track and wafer inspection method using the same | Yi-Ju Chen | 2023-06-06 |
| 11557360 | Memory test circuit and device wafer | Yan-De Lin | 2023-01-17 |