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Anuj Doshi

NI Nanotronics Imaging: 1 patents #16 of 27Top 60%
📍 Manhattan, NY: #18 of 46 inventorsTop 40%
🗺 New York: #4,092 of 11,993 inventorsTop 35%
Overall (2023): #521,422 of 537,848Top 100%
1
Patents 2023

Issued Patents 2023

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
11727672 System and method for generating training data sets for specimen defect detection Jonathan Lee, John B. Putman 2023-08-15