Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11573190 | Calibration method for X-ray measuring device | Hiromu MAIE, Seiji Sasaki, Jyota Miyakura | 2023-02-07 |
| 11561091 | Dimension measurement method using projection image obtained by X-ray CT apparatus | Yutaka Ohtake, Tasuku Ito, Tomonori Goto | 2023-01-24 |