HW

Huifang Wu

MT Mettler-Toledo (Changzhou) Measurement Technology: 1 patents #3 of 45Top 7%
MI Mettler-Toledo (Changzhou) Precision Instruments: 1 patents #3 of 45Top 7%
MC Mettler-Toledo International Trading (Shanghai) Co.: 1 patents #3 of 45Top 7%
Overall (2023): #418,934 of 537,848Top 80%
1
Patents 2023

Issued Patents 2023

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
11846539 Method and system for measuring interference in a checkweighing device Shilong Wang, Ming Cai, Qi Han, Dongjie Qiu, Wenjun Jiang +2 more 2023-12-19