Issued Patents 2023
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11815555 | Universal compactor architecture for testing circuits | Yingdi Liu, Nilanjan Mukherjee, Grzegorz Mrugalski, Jerzy Tyszer, Bartosz Wlodarczak | 2023-11-14 |
| 11585853 | Trajectory-optimized test pattern generation for built-in self-test | Grzegorz Mrugalski, Nilanjan Mukherjee, Lukasz Rybak, Jerzy Tyszer | 2023-02-21 |
| 11555854 | Deterministic stellar built-in self test | Yingdi Liu, Nilanjan Mukherjee, Jerzy Tyszer | 2023-01-17 |