Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11804276 | Built-in-self-test logic, memory device with same, and memory module testing method | Eunhye Oh, Yong Ki Lee, Gapkyoung Kim, Taewook Park | 2023-10-31 |
| 11593527 | Security circuit including dual encoder and endecryptor including the security circuit | Hyesoo Lee, Hongmook Choi, Jisu Kang, Hyunil Kim, Jonghoon Shin | 2023-02-28 |