CL

Chang-Ock Lee

KAIST: 1 patents #349 of 1,375Top 30%
Overall (2023): #488,550 of 537,848Top 95%
1
Patents 2023

Issued Patents 2023

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
11547379 Method and apparatus for scatter artifacts correction in industrial 3-dimensional cone beam computed tomography Soomin Jeon 2023-01-10