Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11852458 | Oxide film thickness measurement device and method | Hiroyuki Takamatsu, Ryota Nakanishi | 2023-12-26 |
| 11761752 | Device and method for measuring oxide film thickness | Hiroyuki Takamatsu, Ryota Nakanishi | 2023-09-19 |