Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11686690 | System and method for inspection and metrology of four sides of semiconductor devices | Bert Vangilbergen, Harry Paredaens, Foon Ming Chan | 2023-06-27 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11686690 | System and method for inspection and metrology of four sides of semiconductor devices | Bert Vangilbergen, Harry Paredaens, Foon Ming Chan | 2023-06-27 |