Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11676264 | System and method for determining defects using physics-based image perturbations | Martin Plihal, Saravanan Paramasivam, Niveditha Lakshmi Narasimhan, Sairam Ravu, Somesh Challapalli +1 more | 2023-06-13 |