GL

Gilad Laredo

KL Kla: 1 patents #90 of 318Top 30%
Overall (2023): #438,304 of 537,848Top 85%
1
Patents 2023

Issued Patents 2023

Patent #TitleCo-InventorsDate
11573497 System and method for measuring misregistration of semiconductor device wafers utilizing induced topography Daria Negri, Amnon Manassen 2023-02-07