Issued Patents 2023
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11748871 | Alignment of a specimen for inspection and other processes | Tong Huang, N R Girish, Yiyu Zhang, Faisal Omer, Wei Kang +2 more | 2023-09-05 |
| 11676260 | Variation-based segmentation for wafer defect detection | — | 2023-06-13 |
| 11610296 | Projection and distance segmentation algorithm for wafer defect detection | JuHwan Rha | 2023-03-21 |