Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11774371 | Defect size measurement using deep learning methods | Jason Kirkwood | 2023-10-03 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11774371 | Defect size measurement using deep learning methods | Jason Kirkwood | 2023-10-03 |