Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11703465 | Apparatus for inspecting semiconductor device and method for inspecting semiconductor device | Nobuhito KUGE, Toshihisa Fujiwara, Yui Fujiwara | 2023-07-18 |
CU
Chisaki Usui
Overall (2023): #483,590 of 537,848Top 90%
1
Patents 2023