Issued Patents 2023
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11593930 | Inspection apparatus, inspection method and storage medium that detects defects in images | Hideaki Okano, Takeshi Morino | 2023-02-28 |
| 11587223 | Inspection apparatus that detects defect in image and inspection method and storage medium thereof | Hideaki Okano | 2023-02-21 |