Issued Patents 2023
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11545336 | Scanning electron microscopy system and pattern depth measurement method | Takahiro Nishihata, Mayuka Osaki, Takuma Yamamoto, Yusuke Iida | 2023-01-03 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11545336 | Scanning electron microscopy system and pattern depth measurement method | Takahiro Nishihata, Mayuka Osaki, Takuma Yamamoto, Yusuke Iida | 2023-01-03 |