Issued Patents 2023
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11788976 | X-ray measurement apparatus and X-ray measurement method | Fuminori Uematsu | 2023-10-17 |
| 11699567 | X-ray detection apparatus and method | — | 2023-07-11 |
| 11674913 | Sample analysis apparatus and method | Takaomi Yokoyama | 2023-06-13 |
| 11668662 | Sample analysis apparatus and method | Yasuaki Yamamoto | 2023-06-06 |